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2 research outputs found
Fine-grained fault tolerance using device checkpoints
Author
Asim Kadav
Bailey K.
+17Â more
Boyd-Wickizer S.
Brumley D.
C. Clark
Chun B.
Corbet J.
David F. M.
Erlingsson Úlfar
Fraser K.
Larus J. R.
Matthew J. Renzelmann
Membrane S. Sundararaman
Michael M. Swift
Paxson V.
Ramachandran P.
SafeDrive F. Zhou
Swift M. M.
Williams D.
Publication venue
'Association for Computing Machinery (ACM)'
Publication date
Field of study
Full text link
Crossref
Fine-grained fault tolerance using device checkpoints
Author
Bailey K.
Boyd-Wickizer S.
+14Â more
Brumley D.
C. Clark
Chun B.
Corbet J.
David F. M.
Erlingsson Úlfar
Fraser K.
Larus J. R.
Membrane S. Sundararaman
Paxson V.
Ramachandran P.
SafeDrive F. Zhou
Swift M. M.
Williams D.
Publication venue
'Association for Computing Machinery (ACM)'
Publication date
Field of study
No full text
Crossref